The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.

The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.

Date of Patent:
Dec. 14, 1999

Filed:

Aug. 22, 1997
Applicant:
Inventors:

Rakesh Agrawal, San Jose, CA (US);

Johannes Ernst Gehrke, Madison, WI (US);

Dimitrios Gunopulos, San Jose, CA (US);

Prabhakar Raghavan, Saratoga, CA (US);

Attorney:
Primary Examiner:
Assistant Examiner:
Int. Cl.
CPC ...
G06F / ;
U.S. Cl.
CPC ...
707-7 ; 707-1 ; 707-6 ;
Abstract

A method for finding clusters of units in high-dimensional data having the steps of determining dense units in selected subspaces within a data space of the high-dimensional data, determining each cluster of dense units that are connected to other dense units in the selected subspaces within the data space, determining maximal regions covering each cluster of connected dense units, determining a minimal cover for each cluster of connected dense units, and identifying the minimal cover for each cluster of connected dense units.


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