The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.
The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.
Patent No.:
Date of Patent:
Dec. 14, 1999
Filed:
Jun. 16, 1997
Motorola Inc, Austin, TX (US);
Abstract
A test system (10) for testing real-time angle/time based control systems includes a digital signal generator (16), a multi-channel pulse analyzer (22), and a test system host (12). The test system host (12) controls the execution of a user generated test script. The script specifies test stimuli, external angle/time event interrupts for use by the digital signal generator (16) to a device under test (DUT) (20), and angle/time triggers used by the analyzer (22) to test the DUT (20). Using the test stimuli and external angle/time event interrupts, the DUT (20) is exercised to determine whether or not the DUT (20) and corresponding control system software operate properly. Output data from the DUT (20) are monitored by the pulse analyzer (22), which records the output data based on information specified in the script. Test results are then retrieved by the test system host (12).