The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.

The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.

Date of Patent:
Dec. 14, 1999

Filed:

May. 30, 1997
Applicant:
Inventors:

Roger A Faulkner, Mountain View, CA (US);

Timothy P Marsland, Half Moon Bay, CA (US);

Assignee:

Sun Microsystems, Inc., Palo Alto, CA (US);

Attorney:
Primary Examiner:
Assistant Examiner:
Int. Cl.
CPC ...
G06F / ;
U.S. Cl.
CPC ...
395704 ; 395672 ;
Abstract

Apparatus, methods and computer program products are disclosed that create an 'agent LWP' in a target process. Creation of the agent LWP allows a controlling process to control execution of computer instructions within the target process without co-opting an existing LWP in the target process. The invention thus provides a mechanism that does not unintentionally change the state of the target process because existing partially-completed system calls do not need to be aborted and reissued.


Find Patent Forward Citations

Faulkner, Roger. (1999). Method and apparatus for non-damaging process debugging via an agent (U.S. Patent No. 6002870). U.S. Patent and Trademark Office. https://idiyas.com/patent/badge/6002870

Data source: USPTO (United States Patent and Trademark Office) public patent records. Weekly synchronization. How IDiyas builds this profile

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