The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.
The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.
Patent No.:
Date of Patent:
Dec. 14, 1999
Filed:
Jul. 29, 1998
Robert Rothfritz, Marietta, GA (US);
Scott Kerr, Stone Mountain, GA (US);
Glenn Steven Arche, Duluth, GA (US);
Scott Kellogg, Duluth, GA (US);
Gregory J Newman, Atlanta, GA (US);
Mark A Samuels, Norcross, GA (US);
Richard Lachlan Fowler, Lawrenceville, GA (US);
Shabbir Bambot, Suwanee, GA (US);
Spectrx, Inc., Norcross, GA (US);
Abstract
A combined infection shield and calibration or reference target for use with a measuring instrument includes a removable calibration/reference layer. The removable calibration/reference layer has predetermined optical characteristics that can be utilized to calibrate or reference the instrument. The calibration/reference layer may have predetermined reflectance or scattering properties, a predetermined transmissivity to light, or it may have predetermined fluorescence properties. When the calibration/reference layer is removed from the remaining portions of the device, the portion of the calibration/reference layer having the predetermined optical characteristics is irrevocably altered such that the calibration/reference layer cannot be reused. The combined infection shield and target may be attached to a shield holder, which in turn is attached to an instrument. Alternatively, the infection shield and target may be attached directly to an instrument.