The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.

The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.

Date of Patent:
Dec. 14, 1999

Filed:

Aug. 19, 1997
Applicant:
Inventors:

Mark L Gilbert, Auburn, CA (US);

Robert J Wharton, Rocklin, CA (US);

Assignee:

Hewlett-Packard Company, Palo Alto, CA (US);

Attorney:
Primary Examiner:
Assistant Examiner:
Int. Cl.
CPC ...
G01R / ;
U.S. Cl.
CPC ...
324755 ; 324754 ;
Abstract

An interconnect adapter is used in operational environment testing of a printed circuit assembly unit. The interconnect adapter includes a main base assembly, a probe plate assembly and an engagement unit. The main base assembly includes an attachment structure for attaching the printed circuit assembly unit to the main base assembly. The printed circuit assembly unit, when attached to the main base assembly, is in position to be connected to a host device. The probe plate assembly is attached to the main base assembly and includes pins for electrical connection to test points for an integrated circuit on the printed circuit assembly unit. The engagement unit is for engaging the pins of the probe plate assembly in position to make electrical connection with the test points.


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