The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.

The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.

Date of Patent:
Dec. 14, 1999

Filed:

Mar. 10, 1998
Applicant:
Inventors:

Eiichi Ogishima, Otawara, JP;

Kazuya Akaki, Tochigi-ken, JP;

Assignee:

Kabushiki Kaisha Toshiba, Kawasaki, JP;

Attorney:
Primary Examiner:
Assistant Examiner:
Int. Cl.
CPC ...
A61B / ;
U.S. Cl.
CPC ...
600440 ; 600449 ; 600443 ;
Abstract

At a measuring time, when at least one desired measurement category is selected from among a plurality of measurement categories associated with an ultrasonic image, at least one measurement item is selected from among a plurality of measurement items under the selected measurement category. Measurements corresponding to the selected measurement items are made sequentially. A title of those selected measurement items is inserted in a report. Since the title of those not-selected measurement items is not inserted in the report, there never occurs a situation in which the actually measured items and measurement results are buried in a vast number of measurement items, making it difficult to find them. That is, it is possible to minimize the number of pages and, by doing so, easily review the full actual measurement items one at a time on one screen or on one page and simply do this while being scrolled fewer times on a display screen or eye-scanning the pages of the report as required.


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