The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.
The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.
Patent No.:
Date of Patent:
Dec. 14, 1999
Filed:
Mar. 04, 1997
K Elliott Cramer, Newport News, VA (US);
William P Winfree, Williamsburg, VA (US);
Abstract
A method and a portable apparatus for the nondestructive identification of defects in structures. The apparatus comprises a heat source (20) and a thermal imager (30) that move at a constant speed past a test surface (10) of a structure. The thermal imager (30) is off set at a predetermined distance from the heat source (10). The heat source (10) induces a constant surface temperature. The imager (20) follows the heat source (10) and produces a video image of the thermal characteristics of the test surface. Material defects produce deviations from the constant surface temperature that move at the inverse of the constant speed. Thermal noise produces deviations that move at random speed. Computer averaging of the digitized thermal image data with respect to the constant speed minimizes noise and improves the signal of valid defects. The motion of thermographic equipment coupled with the high signal to noise ratio render it suitable for portable, on site analysis.