The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.

The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.

Date of Patent:
Dec. 14, 1999

Filed:

May. 01, 1998
Applicant:
Inventor:

Frans J Van de Velde, Boston, MA (US);

Assignee:

Jozef F. Van de Velde, Oosterzele, BE;

Attorney:
Primary Examiner:
Int. Cl.
CPC ...
A61B / ;
U.S. Cl.
CPC ...
351205 ;
Abstract

Maxwellian view and modulation control options for the scanning laser ophthalmoscope allow knowing, maintaining and systematically varying the entrance location of the Maxwellian view used for imaging or functional testing of a particular retinal test location. The scanning laser ophthalmoscope simultaneously images for subsequent digital image processing the anterior and posterior segment of the eye by using a second Newtonian imaging device or by repositioning the entrance location of the Maxwellian view in such way that vignetting of the anatomical pupil occurs. In the second method, the fixation target is systematically moved within the visible border of the anatomical pupil in order to use another entrance location of the Maxwellian view for a given retinal test location. The main advantages are simplicity of utility and the fact that the scanning laser ophthalmoscope no longer has to move in order to select or maintain a particular entrance location of the Maxwellian view for a given retinal test location.


Find Patent Forward Citations

Van de Velde, Frans. (1999). Maxwellian view and modulation control options for the scanning laser (U.S. Patent No. 6000799). U.S. Patent and Trademark Office. https://idiyas.com/patent/badge/6000799

Data source: USPTO (United States Patent and Trademark Office) public patent records. Weekly synchronization. How IDiyas builds this profile

Loading…