The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.

The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.

Date of Patent:
Dec. 14, 1999

Filed:

Apr. 23, 1998
Applicant:
Inventors:

Akira Nishina, Tokyo, JP;

Hitomi Umehara, Tokyo, JP;

Tetsuya Kimijima, Tokyo, JP;

Assignee:
Attorney:
Primary Examiner:
Assistant Examiner:
Int. Cl.
CPC ...
G01N / ;
U.S. Cl.
CPC ...
73 3103 ; 73-105 ; 250288 ;

Find Patent Forward Citations

Nishina, Akira. (1999). Method for analyzing impurities in gas and its analyzer (U.S. Patent No. 6000275). U.S. Patent and Trademark Office. https://idiyas.com/patent/badge/6000275

Data source: USPTO (United States Patent and Trademark Office) public patent records. Weekly synchronization. How IDiyas builds this profile

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