The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.
The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.
Patent No.:
Date of Patent:
Dec. 07, 1999
Filed:
May. 02, 1997
Robert S Lynch, Jr, Groton, CT (US);
Peter K Willett, Coventry, CT (US);
The United States of America as represented by the Secretary of the Navy, Washington, DC (US);
Abstract
A classification system uses sensors to obtain information from which feaes which characterized a source or object to classified can be extracted. The features are extracted from the information and compiled into a feature vector which is then quantized to one of one of M discrete symbols. After N feature vectors have been quantized, a test vector having components which are defined by the number of occurrences of each of the M symbols in N the quantized vectors is built. The system combines the test vector with training data to simultaneously estimate symbol probabilities for each class and classify the test vector using a decision rule that depends only on the training and test data. The system classifies the test vector using either a Combined Bayes test or a Combined Generalized likelihood ratio test.