The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.
The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.
Patent No.:
Date of Patent:
Dec. 07, 1999
Filed:
Sep. 26, 1997
Dale A Messner, Uniontown, OH (US);
John D Schellenberg, Cleveland Heights, OH (US);
Patrick A Dayton, Munroe Falls, OH (US);
Picker International, Inc., Cleveland, OH (US);
Abstract
A microscope calibrator probe includes a handle, a tool head connected to the handle, a viewable target connected to an end of the tool head opposite the handle, and three or more position signaling devices disposed on the handle for tracking the probe in an image guided surgery system. The tool head includes a bend of approximately 90 degrees to provide easy placement of the viewable target on an object being viewed below a microscope. Other angles for the bend are also acceptable. A precise location of the object being viewed is determined by sensing a location the three or more position signaling devices disposed on the handle with respect to an operating room reference frame and knowing an offset between the position signaling devices and a bottom surface of the viewable target in contact with the object. Additionally, the viewable target includes a viewable aperture for calibrating a line of sight of the microscope and a means for indicating a rotational sense of the viewable target.