The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.
The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.
Patent No.:
Date of Patent:
Dec. 07, 1999
Filed:
Oct. 29, 1997
Applicant:
Inventors:
Shigeki Kobayashi, Yotsukaido, JP;
Kazuhito Ishihara, Tokyo, JP;
Assignee:
Terumo Kabushiki Kaisha, Tokyo, JP;
Attorney:
Primary Examiner:
Int. Cl.
CPC ...
H05G / ;
U.S. Cl.
CPC ...
378163 ; 378162 ;
Abstract
To provide a method and an instrument capable of easily and accurately measuring a size of an affected part present in a body of a patient, there is provided a measuring instrument 1 including at least four sheets of acrylic plates having indices of a substance of X-ray image forming performance of metal balls 2 and 3, metal wires and the like in which sets of two sheets of the acrylic plates are arranged in parallel to each other and a space defined by the sets of acrylic plates arranged in parallel, is provided with an interval capable of receiving a part of a patient to be measured, such as the head or the like.