The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.
The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.
Patent No.:
Date of Patent:
Dec. 07, 1999
Filed:
Mar. 06, 1998
Applicant:
Inventors:
Takeshi Ihara, Kawasaki, JP;
Yoichi Oikawa, Sapporo, JP;
Assignee:
Fujitsu Limited, Kawasaki, JP;
Attorney:
Primary Examiner:
Assistant Examiner:
Int. Cl.
CPC ...
H04J / ; G01N / ;
U.S. Cl.
CPC ...
359124 ; 359125 ; 356 731 ;
Abstract
Waveform degradation due to chromatic dispersion of an optical fiber is detected and compensated for. A waveform detector detects a change in waveform, based on the ratio between the powers of a plurality of frequency components or on peak or duty detection, and the frequency bandwidth of an equalizing amplifier or the chromatic dispersion of an optical fiber is controlled based on the result of the detection.
Ihara, Takeshi. (1999). Detection of, and compensation for, waveform change due to chromatic (U.S. Patent No. 5999289). U.S. Patent and Trademark Office. https://idiyas.com/patent/badge/5999289
Data source: USPTO (United States Patent and Trademark Office) public patent records. Weekly synchronization. How IDiyas builds this profile