The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.

The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.

Date of Patent:
Dec. 07, 1999

Filed:

Jan. 05, 1998
Applicant:
Inventors:

Richard Myers, Gibsonia, PA (US);

Edward A Smierciak, Pittsburgh, PA (US);

Assignee:

United Sciences, Inc., Gibsonia, PA (US);

Attorney:
Primary Examiner:
Assistant Examiner:
Int. Cl.
CPC ...
G01N / ;
U.S. Cl.
CPC ...
356336 ; 356339 ; 356343 ;
Abstract

In a method for monitoring particulates in stacks or ducts a back-scatter monitor uses a solid-state laser to emit a collimated beam, the intensity of which is controlled via feedback from a reference detector. The beam is split so that part goes to a reference surface for calibration checks, and part is directed to pass at a selected angle through a gaseous sample. Optical energy scattered from particles in the sample is detected by viewing optics to provide an indication of particulate concentration. The beam steering mechanism can direct the optics to view scattering along a selectable axis that intersects the laser beam at a specified location within the gaseous sample. The method can be used to determine the opacity of the gaseous sample providing a basis for correlation to particulate loading of that portion of the particulates that are of a size comparable to the wavelength of light.


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