The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.
The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.
Patent No.:
Date of Patent:
Dec. 07, 1999
Filed:
May. 11, 1998
Solutia Inc., St. Louis, MO (US);
Abstract
A method for measuring a physical property of a polymer sample includes measuring a portion of a Raman spectrum of the polymer sample, determining a value of a preselected spectral feature from the portion of the Raman spectrum, and comparing the determined value to reference values. The value of the preselected spectral feature depends functionally on the physical property. The reference values relate the preselected spectral feature to the physical property. A probe includes a housing; first, second, and third optical systems attached to the housing; and a first optical filter located along a first direction. The first optical system is to collimate an illumination beam along the first direction. The first optical filter is to produce substantially monochromatic light and is insertable into the probe without substantially affecting an alignment between the probe and the sample. The second optical system is to focus light from the first optical filter on the sample and to collimate scattered light from the sample along a second direction. The third optical system is to focus scattered light from the second direction onto an aperture.