The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.
The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.
Patent No.:
Date of Patent:
Dec. 07, 1999
Filed:
Feb. 27, 1998
Applicant:
Inventors:
Tougo Teramoto, Wakayama, JP;
Tetsuya Arimoto, Sakai, JP;
Assignee:
Minolta Co., Ltd., Osaka, JP;
Attorney:
Primary Examiner:
Int. Cl.
CPC ...
G01B / ;
U.S. Cl.
CPC ...
356127 ; 356400 ; 2502011 ;
Abstract
A lens testing apparatus detects and evaluates inclination of the image plane as caused by decentering of an optical system. The apparatus has an image provider, a plurality of focusing position detectors, and a calculator. The image provider provides an image to a lens system to be tested for decentering. The detectors detect a focusing position on which light rays exiting from the lens system focus. The calculator calculates inclination of the image plane based on the focusing position detected by the detectors.