The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.
The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.
Patent No.:
Date of Patent:
Dec. 07, 1999
Filed:
Apr. 15, 1998
John Robert Elliott, Rochester, MN (US);
International Business Machines Corporation, Armonk, NY (US);
Abstract
A tristate driver/receiver test circuit and an improved method are provided for parametric testing of variable voltage and variable impedance tristate driver and receiver circuits. The tristate driver/receiver test circuit includes a plurality of tristate driver/receiver pairs. The plurality of tristate driver/receiver pairs represent a plurality of parametrics including multiple voltage and impedance levels. A decoder having an input and an output enables one of the plurality of tristate driver/receiver pairs. The decoder output includes a plurality of decoder output lines. Each decoder output line is coupled to a respective one of the plurality of tristate driver/receiver pairs. Parametric select inputs are applied to the decoder input for selecting one of the plurality of tristate driver/receiver pairs. In the testing method, a first parametric test is performed. Then checking for special parametric tests is provided. Responsive to identifying special parametric tests, additional parametric tests are sequentially performed. The parametric select input is changed and an additional parametric test is performed until all parametrics are tested.