The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.
The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.
Patent No.:
Date of Patent:
Dec. 07, 1999
Filed:
Jan. 13, 1998
Applicant:
Inventor:
Tomio Sugahara, Osaka, JP;
Assignee:
Sugan Co., Ltd., Osaka, JP;
Attorney:
Primary Examiner:
Assistant Examiner:
Int. Cl.
CPC ...
A61B / ;
U.S. Cl.
CPC ...
600561 ; 600587 ; 73715 ; 737291 ;
Abstract
A probe for measuring epidural pressure and the elasticity of brain parenchyma includes first and second chambers both formed of a thin film with a bag-shape so that they can contract/expand in response to introduction of first and second pressure transmission mediums, respectively, wherein the first and second chambers are independent of each other and provided in a stack. Thus a probe capable of accurately measuring epidural pressure and the elasticity of brain parenchyma can be provided.
Sugahara, Tomio. (1999). Probe for measuring epidural pressure and elasticity of brain parenchyma (U.S. Patent No. 5997484). U.S. Patent and Trademark Office. https://idiyas.com/patent/badge/5997484
Data source: USPTO (United States Patent and Trademark Office) public patent records. Weekly synchronization. How IDiyas builds this profile