The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.
The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.
Patent No.:
Date of Patent:
Nov. 30, 1999
Filed:
Jul. 09, 1997
Akihiro Andoh, Nakai-machi, JP;
Shunichi Kimura, Nakai-machi, JP;
Shinji Shishido, Nakai-machi, JP;
Yutaka Koshi, Nakai-machi, JP;
Fuji Xerox Co., Ltd, Tokyo, JP;
Abstract
The present invention has an object to determine whether image data is generated by data processing such as PDL, or optically captured scan-in image, for each area. To achieve the object, a determining table is provided for distribution patterns of pixels having substantially the same pixel value for image data area composed of plural pixels. Then a reference area designating unit designates a reference area by selecting from input image data the pixel of interest having a pixel value and the reference pixels surrounding thereof. A same pixel value distribution generating unit compares the pixel value of the pixel of interest with the pixel values of the reference pixels in the reference area to generate a distribution pattern of the pixel having substantially the same pixel value. Next, a determining unit compares the generated distribution pattern with the distribution patterns held in the determining table to determine the reference area to be the image data generated by data processing.