The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.

The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.

Date of Patent:
Nov. 30, 1999

Filed:

Apr. 23, 1997
Applicant:
Inventors:

Shinya Hasegawa, Kawasaki, JP;

Shigeo Kayashima, Kawasaki, JP;

Satoshi Maeda, Kawasaki, JP;

Hirokazu Aritake, Kawasaki, JP;

Assignee:

Fujitsu Limited, Kawasaki, JP;

Attorney:
Primary Examiner:
Assistant Examiner:
Int. Cl.
CPC ...
C02B / ;
U.S. Cl.
CPC ...
359 17 ; 359 18 ; 359 16 ; 359 15 ;
Abstract

A method of manufacturing a fixed hologram plate of a light-beam scanning apparatus for diffracting a light incident from a light source portion by a rotatable hologram, scanning by the diffracted light through the rotation of the rotatable hologram, diffracting the resulting light by the fixed hologram plate, and for conducting a light-beam scanning on a scanning surface. The method includes the steps of preparing an interference fringe distribution of the fixed hologram plate by two waves: a first wave having a spherical aberration, a transverse aberration of the first wave is in the Y direction, the transverse wave including an astigmatism and a coma; and a second wave having a spherical aberration and astigmatism, and having a wavelength different from a wavelength of a reconstructing wave that is selected to minimize distortion, wherein a transverse aberration of the second wave is in the X direction.


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