The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.
The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.
Patent No.:
Date of Patent:
Nov. 30, 1999
Filed:
Oct. 27, 1997
Tatsuo Yoshino, Kanagawa, JP;
Fuji Photo Film Co., Ltd., Kanagawa, JP;
Abstract
An apparatus for obtaining information from a film includes a CCD line sensor for dividing a photographic film into a multiplicity of portions to meter portions in a predetermined range, including the image recording range on the photographic film, to sequentially output photometric data; an optical film for reducing a light beam made incident on the CCD line sensor from a region in the predetermined range and outside the image recording range on the photographic film; photometric condition adjusting component for adjusting the photometric condition of the CCD line sensor such that it corresponds to the quantity of a light beam made incident on the CCD line sensor from the image recording range; sampling circuits for extracting, from photometric data output from the CCD line sensor, photometric data of a portion on the photographic film in which a predetermined optical characteristic corresponding to information, which must be detected or obtained from the photographic film, exists by a film edge detecting sampling circuit, film movement detecting sampling circuit, a DX code detecting sampling circuit, a frame position detecting sampling circuit, a frame size detecting sampling circuit and an exposure controlling image data sampling circuit and memories arranged to store photometric data extracted by the sampling circuits and connected to each sampling circuit.