The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.
The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.
Patent No.:
Date of Patent:
Nov. 30, 1999
Filed:
Mar. 17, 1998
Other;
Abstract
The present invention provides an improved optical coherence tomography system and involves estimating the impulse response (which is indicative of the actual reflecting and scattering sites within a tissue sample) from the output interferometric signal of an interferometer according to the following steps: (a) acquiring auto-correlation data from the interferometer system; (b) acquiring cross-correlation data from the interferometer system having the biological tissue sample in the sample arm; and (c) processing the auto-correlation data and the cross correlation data to produce an optical impulse response of the tissue. The impulse response may be obtained from the cross-correlation and auto-correlation data by: (d) obtaining an auto-power spectrum from the auto-correlation data by performing a Fourier transform on the auto-correlation data; (e) obtaining a cross-power spectrum from the cross-correlation data by performing a Fourier transform on the cross-correlation data; (f) obtaining a transfer function of the LSI system by taking a ratio of the cross-power spectrum to the auto-power spectrum; and (g) obtaining the optical impulse response of the LSI system by performing an inverse-Fourier transform on the transfer function. Preferably, coherent demodulation is used in combination with the above deconvolution technique to resolve closely-spaced reflecting sites in the sample. By utilizing both the magnitude and phase data of the demodulated interferometric signals, the OCT system of the present invention is able to distinguish between closely spaced reflecting sites within the sample.