The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.
The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.
Patent No.:
Date of Patent:
Nov. 30, 1999
Filed:
Feb. 24, 1997
Applicant:
Inventors:
Chung-I Chiang, Tao-Yuan, TW;
Chih-Wen Hsieh, Taipei, TW;
Long-Jang Hu, Taipei, TW;
Ming-Shing Jou, Tao-Yuan, TW;
Shun-Lih Tu, Taipei, TW;
Horng Chang, Taipei, TW;
Assignee:
Chung-Shan Institute of Science & Technology, Tao-Yuan, TW;
Attorney:
Primary Examiner:
Assistant Examiner:
Int. Cl.
CPC ...
G01C / ;
U.S. Cl.
CPC ...
3336611 ; 3336625 ; 33365 ;
Abstract
An apparatus using piezoelectric effect is provided for measuring an angle between a reference plane and a plane to be measured. Such an apparatus can be used to measure the inclination of a plane or for leveling purpose. The main characteristics of the apparatus are simple in structure, no limitation in the measurement range, and less limitation to the environment. The apparatus also has the following advantages: compact, quick and accurate measurement, easy for multiaxial measurement.