The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.
The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.
Patent No.:
Date of Patent:
Nov. 23, 1999
Filed:
Aug. 11, 1997
Applicant:
Inventors:
Choong-Sun Shin, Seoul, KR;
Yong-Sik Seok, Suwon, KR;
Assignee:
Samsung Electronics, Co., Ltd., Suwon, KR;
Attorney:
Primary Examiner:
Int. Cl.
CPC ...
G11C / ; G06F / ;
U.S. Cl.
CPC ...
714718 ; 714735 ; 714819 ;
Abstract
A novel parallel bit test circuit is provided to test a semiconductor memory device which comprises a number of memory cell arrays each having a plurality of memory cells, a word line provided in each memory cell array to commonly connect with the plurality of memory cells, and a plurality of I/O (input/output) lines respectively connected with the plurality of memory cells of each memory cell array. The parallel bit test circuit for testing the plurality of memory cells in parallel bits comprises a comparator for comparing the data of the memory cells with an externally input data to produce a test signal applied to a data I/O terminal.