The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.
The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.
Patent No.:
Date of Patent:
Nov. 23, 1999
Filed:
Feb. 18, 1998
Takeshi Fukuda, Yokohama, JP;
Kunikazu Yoda, Machida, JP;
Takeshi Tokuyama, Machida, JP;
Shinichi Morishita, Yokohama, JP;
International Business Machines Corporation, Armonk, NY (US);
Abstract
The present application discloses a method and apparatus for extracting association rules from data having two or more numeric attributes and a true-false attribute, and for presenting the rules in an easily understandable form. The method comprises the steps of: (i) storing numbers u(i,j) and v(i,j) of data in each pixel whose true-false attribute is true, so as to correspond to each pixel in a plane; (ii) inputting a condition .theta.; (iii) segmenting from the plane a rectilinear region S of the pixels to maximize the equation ##EQU1## ;and (iv) outputting data included in the segmented rectilinear region S. The invention also allows regions to be derived which satisfy a desired support maximization rule, confidence maximization rule, optimized entropy rule, and optimized interclass variance rule.