The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.

The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.

Date of Patent:
Nov. 23, 1999

Filed:

Sep. 16, 1997
Applicant:
Inventors:

Brian T McKeon, Newport, RI (US);

Mark C Larson, Newport, RI (US);

Douglas H Sherman, Cranston, RI (US);

Attorneys:
Primary Examiner:
Assistant Examiner:
Int. Cl.
CPC ...
G06F / ;
U.S. Cl.
CPC ...
395704 ; 395704 ; 395705 ;
Abstract

A system is provided for developing program test sets with test hardware conforming to well known test industry standards, such as VXI, VME and GPIB standards. The system has a computer with a display console. After initialization and password checks, the console displays a front panel from which a user chooses the instruments, switches, connections, inputs, outputs, etc. which make up the program test set. As each choice is made, the system generates test script corresponding to the choice. The system then uses the test script, or macro, to generate the graphical representation of the component and its connections on the display. The graphical displays are standardized for each functional component or operation of a program test set, as well as being standardized between program test sets. The macros further allow a program test set to be more efficiently developed by coding macros rather than by developing graphical displays. The combined macros for the entire test set provide written documentation for the program test set, allowing for easy configuration management of the program test set.


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