The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.

The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.

Date of Patent:
Nov. 23, 1999

Filed:

Feb. 21, 1997
Applicant:
Inventors:

Teruyoshi Tsunashima, Tokyo, JP;

Tamio Hara, Nagoya, JP;

Kozo Ando, Tokyo, JP;

Attorney:
Primary Examiner:
Assistant Examiner:
Int. Cl.
CPC ...
G02B / ; G02B / ;
U.S. Cl.
CPC ...
359618 ; 359629 ; 359640 ;
Abstract

Lens systems are disclosed having multiple focal lines and that are operable to form multiple narrow superimposable focal lines. The focal lines typically have linewidths of .ltoreq. approximately 10 .mu.m, formed from an incident light flux from a laser. The superimposed focal lines can have sufficient energy density to serve as a pumping-laser source for an X-ray laser. The lens systems comprise, axially from the incident light side, a wave-surface splitter and a focusing system. The wave-surface splitter splits the wave surface of the incident light into subfluxes. The focusing system focuses the subfluxes into respective linear focal lines that can be superimposed to form a combined focal line having very high energy density. The wave-surface splitter is preferably a prism having multiple facets with respective prism angles; the focusing system preferably comprises multiple cylindrical lenses each having a generation line perpendicular to the ridge lines separating the facets of the prism.


Find Patent Forward Citations

Loading…