The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.
The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.
Patent No.:
Date of Patent:
Nov. 23, 1999
Filed:
Sep. 18, 1997
Philip D Henshaw, Carlisle, MA (US);
Robert F Dillon, Stoneham, MA (US);
Sparta, Inc., Lexington, MA (US);
Abstract
An improved interferometer measuring system that corrects for errors in the determination of the position of a measurement reflector along a measurement path due to the presence of an atmosphere (e.g. atmospheric turbulence) along the path is disclosed. The system includes a two-wavelength interferometer for measuring the atmosphere and a basic length interferometer for a basic measurement of a change in position of the measurement reflector. A calibration procedure for correcting the basic measurements made by the basic length interferometer uses first and second correction coefficients related to the average refractivity of the atmosphere and the change in the refractivity of the atmosphere, respectively. The coefficients can be determined by interferometric measurements or from a combination of interferometric measurements and data from an atmospheric sensor(s), including a humidity sensor. The two-wavelength interferometer can include a pulsed laser source, a compact reference path element, and path length adjustment element. An algorithm is disclosed for efficiently determining the phase difference between the two beams of the two-wavelength interferometer. Beam combining techniques and apparatus for combining the beams of the two-wavelength interferometer and the basic length measurement interferometer while preserving the polarization of the laser beams are also disclosed. The data obtained from the two-wavelength interferometer can be corrected, based on measurements made by the basic length interferometer, for aging due to the movement of the reflecting mirror subsequent to measurement of the atmosphere by the two-wavelength interferometer.