The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.
The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.
Patent No.:
Date of Patent:
Nov. 23, 1999
Filed:
Oct. 28, 1998
Noboru Higashi, Neyagawa, JP;
Kurashiki Boseki Kabushiki Kaisha, Okayama, JP;
Abstract
An optical system for measuring an optical density of a sample in which homogeneity of light employed for measuring the density thereof is secured by including optical information upon a light source uniformly inside a measurement space about an optical axis therein even if the fluctuation occur in the light source in the system. A beam of light emitted from the light source and then focused on an interference filter is transformed into a parallel light through a collimator lens, and the parallel light is then split into two parallel pencils of light by an optical mask. The parallel light uniformly includes the optical information upon the light source. A reference cell is placed in a first split parallel pencil of light, and a sample cell is placed in a second split parallel pencil of light. The lights that have passed through the two cells are focused on an optical receiver by a focusing lens.