The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.

The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.

Date of Patent:
Nov. 23, 1999

Filed:

Sep. 30, 1997
Applicant:
Inventors:

Lloyd F Linder, Agoura Hills, CA (US);

Erick M Hirata, Torrance, CA (US);

Benjamin Felder, Saugus, CA (US);

William W Cheng, Redondo Beach, CA (US);

Robert Tso, S. San Gabriel, CA (US);

Assignee:

Raytheon Company, Lexington, MA (US);

Attorneys:
Primary Examiner:
Int. Cl.
CPC ...
H03M / ;
U.S. Cl.
CPC ...
341131 ;
Abstract

A dither circuit is monolitically integrated with a subranging ADC to add a dither signal at the input of the ADC's fine quantizer element to randomize its nonlinear quantization level errors. Because the subranging ADC has at least one overlap bit, the amplitude of the dither signal can range up to at least 2.sup.M-1 LSBs of the fine quantizer without saturating it. The digital equivalent of the dither signal is subtracted at the output of the fine quantizer to maintain the ADC's overall SNR. The randomization of only the fine quantizer element avoids gaining up the nonlinear errors associated with the dither signal itself thereby improving the overall SNR. This approach optimizes performance for small input signals while sacrificing flexibility to correct other sources of error.


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