The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.

The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.

Date of Patent:
Nov. 23, 1999

Filed:

Jul. 06, 1998
Applicant:
Inventors:

Hajime Akashi, Ohi-machi, JP;

Miwa Takahashi, Ohi-machi, JP;

Yasuhiro Tanaka, Tokyo, JP;

Masakazu Mizukami, Tokyo, JP;

Masahiko Kamada, Tokyo, JP;

Assignee:
Attorney:
Primary Examiner:
Int. Cl.
CPC ...
A21D / ; A21D / ;
U.S. Cl.
CPC ...
426549 ; 426451 ; 426661 ; 127 29 ; 127 32 ;
Abstract

The present invention is directed to a method of assessing suitability of wheat or wheat flour for producing noodles, wherein starch contained in the wheat or wheat flour is analyzed by differential scanning calorimetry for its thermal characteristics and assessment is carried out based on the results of the analysis; wheat flour which is suitable for preparing noodles, wherein the wheat flour is prepared from wheat containing starch having an endothermic enthalpy (.DELTA.H) of 0.3 J/g of dry matter or less at a thermal change onset temperature (To) of 80.degree. C. or higher when the starch is analyzed by differential scanning calorimetry in the presence of added water; and use of the wheat or wheat flour for preparing noodles.


Find Patent Forward Citations

Akashi, Hajime. (1999). Method of assessing wheat or wheat flour regarding suitability for (U.S. Patent No. 5989617). U.S. Patent and Trademark Office. https://idiyas.com/patent/badge/5989617

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