The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.
The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.
Patent No.:
Date of Patent:
Nov. 23, 1999
Filed:
Jan. 02, 1998
Richard L Trantow, Cincinnati, OH (US);
Manohar Bashyam, West Chester, OH (US);
General Electric Company, Cincinnati, OH (US);
Abstract
A method of non-destructively evaluating or validating a processed area of an object such as a metallic laser shock peened surface by determining Rayleigh wave angles at various positions on the surface. The Rayleigh wave angle is determined by: (a) directing incident beams of ultrasonic waves onto at least one point of a surface at a plurality of incident angles; (b) simultaneously measuring intensity of a combination of corresponding directly reflected and re-radiated beams at a plurality of corresponding reflected angles equal in magnitude to the incident angles with respect to a line normal to the surface; (c) generating a null angle profile of data indicating intensity versus corresponding incident angles from measured intensities in step (b); (d) determining an intensity curve by applying a polynomial curve fit to a low intensity portion of the null angle profile; and (e) determining the effective critical angle for the corresponding Rayleigh wave by determining a substantially minimum point on the curve. The polynomial curve fit may be a second order polynomial fit and the plurality of incident angles and corresponding reflected angles are predetermined and in close proximity to a predetermined critical angle.