The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.

The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.

Date of Patent:
Nov. 16, 1999

Filed:

Jan. 29, 1996
Applicant:
Inventors:

Stephen Andrew Della Pietra, Smithtown, NY (US);

Mark Edward Epstein, Katonah, NY (US);

Martin Franz, White Plains, NY (US);

Joshua David Koppelman, Austin, TX (US);

Salim Estephan Roukos, Scarsdale, NY (US);

Robert Todd Ward, Croton-on-Hudson, NY (US);

Attorney:
Primary Examiner:
Assistant Examiner:
Int. Cl.
CPC ...
G06F / ;
U.S. Cl.
CPC ...
704-9 ; 704-2 ;
Abstract

The invention proposes using statistical methods to do natural language understanding. The key notion is that there are 'strings' of words in the natural language, that correspond to a single semantic concept. One can then define an alignment between an entire semantic meaning (consisting of a set of semantic concepts), and the English. This is modeled using P(E,A.vertline.S). One can model p(S) separately. This allows each parameter to be modeled using many different statistical models.


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