The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.
The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.
Patent No.:
Date of Patent:
Nov. 16, 1999
Filed:
May. 20, 1996
Tatsuya Eguchi, Toyohashi, JP;
Takatoshi Hamada, Toyokawa, JP;
Minolta Co., Ltd, Osaka, JP;
Abstract
A method and apparatus for high resolution multibeam scanning at constant line intervals is disclosed, wherein simultaneous transfer of image data is achieved via multibeam scanning. According to the present invention, exposure scanning is accomplished a plurality of times relative to a single image surface of n scan lines. Each exposure scan is accomplished simultaneously relative to the total M lines using M individual light beams. Each of M individual beams are positioned such that there is a distance of M lines between adjacent beams. Each individual laser beam is used for exposure scanning of mutually different lines. Therefore, the scan lines of the various beams in a next scan cycle are apart (M-1) lines from the scan lines in the previous scanning cycle. In one embodiment of the invention, an image memory controller reads out image data from an image memory in the scan sequence rather than in the line array sequence. In another embodiment of the invention, the image memory controller reads out image data from an image memory in the line array sequence.