The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.
The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.
Patent No.:
Date of Patent:
Nov. 16, 1999
Filed:
Nov. 10, 1994
Applicant:
Inventor:
Shin-Ywan Wang, Tustin, CA (US);
Assignee:
Canon Kabushiki Kaisha, Tokyo, JP;
Attorney:
Primary Examiner:
Int. Cl.
CPC ...
G06K / ;
U.S. Cl.
CPC ...
382173 ; 382226 ;
Abstract
A page analysis system which analyzes image data of a document page includes analysis of image data of one of a plurality of portions of the page, identification of a block of image data which has an association to another separate block of image data, and determination of whether or not picture information in the image data is half-tone line-drawing, joint-line, or unknown.
Quick Actions:
Wang, Shin-Ywan. (1999). Page analysis system (U.S. Patent No. 5987171). U.S. Patent and Trademark Office. https://idiyas.com/patent/badge/5987171
Data source: USPTO (United States Patent and Trademark Office) public patent records. Weekly synchronization. How IDiyas builds this profile