The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.
The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.
Patent No.:
Date of Patent:
Nov. 16, 1999
Filed:
Nov. 13, 1997
Michael G Meyer, Seattle, WA (US);
Shih-Jong J Lee, Bellevue, WA (US);
Paul S Wilhelm, Kirkland, WA (US);
NeoPath, Inc., Redmond, WA (US);
Abstract
A thick group of cells classifier. Image data acquired from an automated microscope from a cytological specimen is processed by a computer system. The computer applies filters at different stages. Obvious artifacts are eliminated from analysis early in the processing. The first stage of processing is image segmentation where objects of interest are identified. The next stage of processing is feature calculation where properties of each segmented thick group object are calculated. The final step is object classification where every segmented thick group object is classified as being abnormal or as belonging to a cellular or non-cellular artifact.