The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.
The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.
Patent No.:
Date of Patent:
Nov. 16, 1999
Filed:
Jul. 22, 1998
Duncan James Webb, Essex, GB;
GEC-Marconi Limited, , GB;
Abstract
An imaging system is provided which comprises an objective lens arrangement, a linear array of detector elements within a detector the array comprising a row of time delay an integrate (TDI) channels and a scanning optic arranged to scan an image over the array detector elements, the system further comprises means for rotating the scanning optic about an axis (N) normal to an optical surface of the scan optic when the scan optic is in the center of its field of view position, the scan optic being rotated about this axis (N) in dependence on the rate at which the imaging system is panned across a scene, such that a received image is vector scanned across the linear array of detector elements to compensate for loss in image resolution due to the panning action of the imaging system occurring during the period in which an image frame is detected.