The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.

The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.

Date of Patent:
Nov. 16, 1999

Filed:

Nov. 07, 1997
Applicant:
Inventors:

Donald A Volk, Mentor, OH (US);

Fernando Diaz-Estevez, Saville, 41002, ES;

Assignee:

Other;

Attorneys:
Primary Examiner:
Assistant Examiner:
Int. Cl.
CPC ...
G02B / ; G02B / ; G02B / ;
U.S. Cl.
CPC ...
359376 ; 359377 ; 359834 ; 359375 ; 359836 ;
Abstract

An inverting and reversing prism system for a stereo microscope having an optical longitudinal axis and left and right eye viewing systems having left and right longitudinal axes, respectively, along which left and right beam paths are transmitted, respectively, comprising: at least four reflecting surfaces (13, 15, 16, 13A and 13A, 15A, 16A, 13) in each beam path (14, 14A), two of the reflecting surfaces (13, 13A and 13A, 13) in each beam path comprising inlet and outlet surfaces, respectively, for deflecting the beam path by 90.degree., the inlet and outlet surfaces in each beam path being oriented 45.degree. relative to the optical longitudinal axis of the microscope and 90.degree. relative to each other, with a line of intersection (26) of planes containing the inlet and outlet surfaces in each beam path defining an angle of 45.degree. with respect to a plane through the left and right longitudinal axes of the left and right eye viewing systems, with at least two other of the reflecting surfaces (15, 16 and 15A, 16A) in each beam path comprising intermediate reflecting surfaces disposed for deflecting the respective beam path from the inlet surface to the outlet surface.


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