The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.
The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.
Patent No.:
Date of Patent:
Nov. 16, 1999
Filed:
May. 29, 1997
Stephen B Alexander, Millersville, MD (US);
Henry H Yaffe, Reisterstown, MD (US);
Ciena Corporation, Linthicum, MD (US);
Abstract
The present invention provides an optical monitoring system for a WDM optical communication system. In an exemplary embodiment, the monitoring system includes a wavelength selecting device which receives a WDM optical communication signal comprising plural optical channels and optical noise (e.g., ASE). The wavelength selecting device separately outputs optical signals corresponding to each of the optical channels and at least one optical noise sample taken at a wavelength which is not occupied by one of the optical channels. At least one optical power meter optically communicates with the wavelength selecting device for measuring the optical power of each of the optical channels and the optical noise sample. The optical power meter outputs an electrical signal indicating the strength of a measured optical channel or of the optical noise sample. A data analyzer, such as a microprocessor, receives the electrical signals output by the power meter and calculates the optical noise at the wavelengths of each of the N optical channels based upon the measured noise sample. Using the calculated optical noise values, the data analyzer determines the signal to noise ratio of each optical channel. Advantageously, the technique of the present invention uses a minimum of power measurements to accurately determine the signal-to-noise ratios of the optical channels.