The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.
The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.
Patent No.:
Date of Patent:
Nov. 16, 1999
Filed:
Jan. 30, 1997
Applicant:
Inventors:
Heinz-Michael Hein, Seeheim-Jugenheim, DE;
Dirk Boecker, Heidelberg, DE;
Matthias Essenpreis, Gauting, DE;
Assignee:
Roche Diagnostics GmbH, Mannheim, DE;
Primary Examiner:
Int. Cl.
CPC ...
G01N / ; A61B / ;
U.S. Cl.
CPC ...
356446 ; 356 39 ; 600473 ; 600476 ;
Hein, Heinz-Michael. (1999). Apparatus and method for the optical characterization of the structure (U.S. Patent No. 5986770). U.S. Patent and Trademark Office. https://idiyas.com/patent/badge/5986770
Data source: USPTO (United States Patent and Trademark Office) public patent records. Weekly synchronization. How IDiyas builds this profile