The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.

The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.

Date of Patent:
Nov. 16, 1999

Filed:

Jun. 15, 1998
Applicant:
Inventor:

William A Challener, Grant, MN (US);

Assignee:

Imation Corp., Oakdale, MN (US);

Attorney:
Primary Examiner:
Assistant Examiner:
Int. Cl.
CPC ...
G01B / ;
U.S. Cl.
CPC ...
356375 ; 356403 ;
Abstract

A method and apparatus for optically assaying a targeted substance in a sample using a sensor having an optimized groove profile. The optical sensor has a grooved surface defined by a first sinusoidal component superposed with one or more additional sinusoidal components such that a reflectance anomaly occurs at multiple resonance angles. A measure of the targeted substance in the sample can more precisely calculated as a function of a change in angular distance between the resonance angles. Advantages of the present invention include increased sensitivity and less susceptibility to system drifts due to mechanical motion and thermal changes than conventional diffraction grating sensors.


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