The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.
The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.
Patent No.:
Date of Patent:
Nov. 16, 1999
Filed:
Sep. 17, 1997
Michael D Seltzer, Ridgecrest, CA (US);
The United States of America as represented by the Secretary of the Navy, Washington, DC (US);
Abstract
Introduction of sample stream air into argon inductively coupled plasma permits continuous monitoring of hazardous air pollutant metals in combustion flue gases. In addition to entrained particulates, various molecular components of flue gas are in the plasma. These species, and reaction products thereof, such as CN species, also undergo excitation resulting in complex emission spectra of appreciable intensity. Serious spectral interference arises for several metal elements, from molecular emission bands associated with the stable CN radical, and other poly-atomic species, such as NO. Failure to account for these interferences can significantly degrade accuracy of monitoring particularly at low metal concentrations in the flue gas. This invention corrects spectral interferences arising from airborne molecular species in the argon plasma even when the magnitudes of spectral interferences encountered during the analysis of airborne metals in flue gases, are of such considerable magnitudes that, if not directly accounted for, would otherwise compromise the quality of measurements of the airborne metals. This method measures and corrects spectral interferences attributed to CN and NO that affect on-line detection of hazardous air pollutant metals. The method incorporates conventional spectrometer hardware and existing instrument software to achieve effective real-time correction of these interferences.