The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.
The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.
Patent No.:
Date of Patent:
Nov. 16, 1999
Filed:
Feb. 27, 1998
Applicant:
Inventors:
Joseph B Slater, Dexter, MI (US);
Michael J Pelletier, Saline, MI (US);
Assignee:
Kaiser Optical Systems, Ann Arbor, MI (US);
Primary Examiner:
Int. Cl.
CPC ...
G01N / ; G01N / ;
U.S. Cl.
CPC ...
356301 ; 356318 ; 2504581 ;
Abstract
An optical probe assembly, which may be used with or without optical fibers for remote operation, incorporates a leak-detecting capability. A source such as a laser is used for optically exciting at least a portion of a sample substance, causing wavelengths characteristic of the sample to be emitted along a collection path for reception by spectral analysis means. The same laser or a different source is employed for optically exciting a point within a test region, causing wavelengths characteristic of any substances contained or entering into the test region to merge with those of the sample within the collection path.