The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.

The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.

Date of Patent:
Nov. 16, 1999

Filed:

Apr. 30, 1997
Applicant:
Inventors:

Hendrik Dijkstra, Eindhoven, NL;

Patrick F Meijers, Eindhoven, NL;

Assignee:

U.S. Philips Corporation, New York, NY (US);

Attorney:
Primary Examiner:
Assistant Examiner:
Int. Cl.
CPC ...
G06F / ;
U.S. Cl.
CPC ...
345429 ;
Abstract

A series of points on a surface is projected onto pixels of an image along a projection axis. Furthermore, texture coordinates are allocated to the points as follows. First a normalized coordinate which is a ratio of the texture coordinate to a depth of the point along the projection axis is determined by linear interpolation. Displacement of the pixel is determined relative to a line in the image onto which a part of the surface, which has a constant depth in the projection direction, is projected. Subsequently, an interpolation function is calculated which interpolates the depth as a function of the displacement. The texture coordinate is determined by multiplication of the normalized coordinate by the depth. The image contribution by the point to an image content of the pixel is determined on the basis of the texture coordinate.


Find Patent Forward Citations

Loading…