The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.
The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.
Patent No.:
Date of Patent:
Nov. 16, 1999
Filed:
Jul. 08, 1997
Applicant:
Inventors:
Futoshi Fukaya, Kawasaki, JP;
Shigeyuki Maruyama, Kawasaki, JP;
Assignee:
Fujitsu Limited, Kanagawa, JP;
Primary Examiner:
Int. Cl.
CPC ...
G01R / ;
U.S. Cl.
CPC ...
324755 ; 324757 ;
Abstract
A testing carrier has a flexible material such as a thin film employed as a supporting body which covers and thrusts a semiconductor device against a substrate. The substrate includes a plurality of contact terminals and a plurality of testing wiring patterns.
Quick Actions:
Fukaya, Futoshi. (1999). Semiconductor device testing carrier and method of fixing semiconductor (U.S. Patent No. 5986459). U.S. Patent and Trademark Office. https://idiyas.com/patent/badge/5986459
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