The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.

The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.

Date of Patent:
Nov. 16, 1999

Filed:

Dec. 02, 1997
Applicant:
Inventors:

Ronald L Hockey, Richland, WA (US);

Douglas M Riechers, Richland, WA (US);

Assignee:

Battelle Memorial Institute, Richland, WA (US);

Attorney:
Primary Examiner:
Int. Cl.
CPC ...
G01N / ; G01R / ;
U.S. Cl.
CPC ...
324240 ; 324262 ;
Abstract

The present invention is an improved sensing unit for detecting flaws in conductive material wherein the sensing coil is positioned away from a datum of either the datum point, the datum orientation, or a combination thereof. Position of the sensing coil away from a datum increases sensitivity for detecting flaws having a characteristic volume less than about 1 mm.sup.3, and further permits detection of subsurface flaws. Use of multiple sensing coils permits quantification of flaw area or volume.


Find Patent Forward Citations

Hockey, Ronald. (1999). Apparatus and method for detecting flaws in conductive material (U.S. Patent No. 5986452). U.S. Patent and Trademark Office. https://idiyas.com/patent/badge/5986452

Data source: USPTO (United States Patent and Trademark Office) public patent records. Weekly synchronization. How IDiyas builds this profile

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