The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.
The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.
Patent No.:
Date of Patent:
Nov. 16, 1999
Filed:
Jan. 21, 1998
Martin Volcker, Konigsbronn-Zang, DE;
Carl-Zeiss-Stiftung, , DE;
Abstract
A probe array for a scanning microscope has numerous individual probes that respectively have a probe tip on one or more beams. The individual probes are arranged in the form of a two-dimensional grid such that the directions of the beams include with respect to the directions of the grid an angle which is not equal to 0.degree. or 180.degree.. The grid spacings in both mutually perpendicular directions can be smaller than the length of the beams, due to the inclined arrangement of the beams relative to the translation vectors of the grid formed by the probe tips (3a-3p). The two beams (4a, 5a) of each individual probe are mutually arranged in a V-shape to form a mutually nested arrangement of the individual probes.