The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.

The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.

Date of Patent:
Nov. 16, 1999

Filed:

Aug. 29, 1997
Applicant:
Inventors:

Mitsuru Oonuma, Tokyo, JP;

Seiji Kamimura, Kokubunji, JP;

Tadao Mimura, Hitachinaka, JP;

Assignee:

Hitachi, Ltd., Tokyo, JP;

Attorney:
Primary Examiner:
Int. Cl.
CPC ...
H01J / ;
U.S. Cl.
CPC ...
250288 ; 250281 ; 250292 ; 250289 ;
Abstract

A mass analyzer comprising a sample preparation mechanism for preliminarily preparing an analyzing sample, an interface mechanism for preparing the sample into ions after the required preliminary preparation, an ion trapping part and analyzing part for analyzing the ions, and a controller. The ion trapping part and analyzing part is placed in a box portion of the body, while the interface mechanism is arranged on the front top of the box portion of the body. When the cover at the front top is removed, the front, top and right side of the interface mechanism are opened.


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