The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.
The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.
Patent No.:
Date of Patent:
Nov. 16, 1999
Filed:
Mar. 11, 1998
Akira Yagi, Sagamihara, JP;
Olympus Optical Co., Ltd., Tokyo, JP;
Abstract
Disclosed is a scanning probe microscope using fluorescent light, comprising a lever section including a probe, an actuator for moving the probe and a sample relative to each other, a light source unit arranged at a position suitable for permitting at least one of the probe and the sample to be irradiated with light having a first wavelength or a second wavelength, which is emitted from the light source unit, and a detecting unit arranged at a position suitable for optically detecting the positional relationship between the probe and the sample, wherein a first fluorescent material, which emits light having the second wavelength when excited with light of the first wavelength, is imparted to one of the probe and the sample, a second fluorescent material, which emits light having a third wavelength when excited with light having the second wavelength, is imparted to the other of the probe and the sample, and the detecting unit optically detects the positional relationship between the probe and the sample based on the light having the third wavelength.