The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.
The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.
Patent No.:
Date of Patent:
Nov. 16, 1999
Filed:
Sep. 22, 1997
Taku Sakazume, Hitachinaka, JP;
Hiroshi Mitsumaki, Mito, JP;
Tomonori Mimura, Tomobe-machi, JP;
Kazumitsu Kawase, Hitachinaka, JP;
Hitachi, Ltd., Tokyo, JP;
Abstract
In an analyzing apparatus of the present invention, sample racks, in each of which a plurality of sample containers are held, are transferred from a rack feeding unit to a discrimination unit for discriminating a type of each sample container. After the discrimination unit, a plurality of analyzing units are installed along a transfer line, and pipetters of different types are provided in the respective analyzing units. The discrimination unit detects information on the length and the width of each sample container held in each sample rack by using an optical detector. A control part selects one of the analyzing units, suitable for analyzing the sample container of which type was discriminated, based on the information detected by the discrimination unit, and transfers the sample container of which type was discriminated, to a sample pipetting position in the selected analyzing unit.